“Non-Intrusive Board Bring-Up: Software tools ensure fast prototype bring-up” - By Alan Sguigna, Vice President Sales and Marketing

Many engineers are turning to software-based non-intrusive embedded instruments to perform tests, to gather validation data and to diagnose any hardware faults that may be present on prototype circuit boards. These tools can be employed before operating firmware or software have been loaded onto the board. Without fixtures or probes, non-intrusive validation, test and debug techniques can accelerate the board bring-up process, reduce the costs associated with board bring-up and help deliver new systems to the marketplace on time.

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“FPGA-Controlled Test (FCT): What it is and why is it needed?”
By Al Crouch, Chief Technologist, Core Instrumentation

“IEEE P1687 Internal JTAG (IJTAG) taps into embedded instrumentation”
By Al Crouch, Chief Technologist, Core Instrumentation

“Non-intrusive Board Test Strategies for the Intel® Xeon® Processor 7500 Series”
By Alan Sguigna, Vice President, Sales and Marketing

“Economics of Embedded Diagnostics for Highly Available Systems”
By Larry Osborn, Technical Product Manager, Processor-Controlled Test and Alan Sguigna, Vice President, Sales and Marketing

“Economics, Technology Drive Industry To Non-Intrusive Board Test”
By Alan Sguigna, Vice President, Sales and Marketing

“Doing More with Less - An IEEE 1149.7 Embedded Tutorial: Standard for Reduced-pin and Enhanced-functionality Test Access Port and Boundary-Scan Architecture”
By Adam Ley, chief technologist – boundary scan test

“Defect Coverage for Non-Intrusive Board Tests”
By Adam Ley, chief technologist – boundary scan test

“Synergy of Two Emerging Standards Will Drive 3D Chip and Circuit Board Test into High Gear”
By Al Crouch, chief technologist – core instrumentation

“Non-intrusive Board Test Strategies for the Intel® Xeon® processor 5500 Series”
By Dave Bonnett, Eric Johnson and Larry Osborn

Position Paper — Embedded Instrumentation Ushers in a New Era for the Test and Measurement Industry — By Glenn Woppman, president and CEO, ASSET InterTech

Frequently Asked Questions (FAQ): Embedded Instrumentation — The future of advanced design validation, test and debug

Media Fact Sheet — Embedded Instrumentation Gains Broad Traction Across the Electronics Industry

Media Fact Sheet — Embedded Instrumentation Comes in Many Shapes, Sizes and Flavors

Lead-free assembly shifts test methods toward boundary scan

Using Boundary Scan to Link Design and Manufacturing Test

Device Modeling Is Critical for Fast Time-to-Test

System Test with Boundary Scan (JTAG)

Fault Coverage Reporting

Boundary scan helps EMS companies cut test costs and increase revenues

Reptron Manufacturing Services – A white paper evaluating ASSET InterTech’s ScanWorks System

Agilent white paper on how ScanWorks has saved Lucent $1 million

Agilent white paper on Jabil’s evaluation of ScanWorks