ASSET InterTech's Boundary-Scan Test, Processor-Controlled Test and Intel® IBIST form a unique set of tools for access to, and control of embedded instrumentation.

 Return to Press Room

 News / Resources

 Feature Story

 Press Releases

 ASSET In The News

 Authored Articles

 Connect Newsletter

 White Papers

 Events

 Educational Videos

 Success Stories

 For Working Media

 Media Contacts

 Image Library

 Company Backgrounders

 Press Kits

Media Contacts:
Bob Greenfield
G&A PR
(972) 254-2887
bob.greenfield@verizon.net

White Papers - Featured

Embedded Diagnostics for Highly Available Systems - by Larry Osborn, Technical Product Manager, Processor-Controlled Test and Alan Sguigna, Vice President, Sales and Marketing

When system manufacturers strive to ensure high availability, they first consider the reliability of the system and how this might be improved as much as possible. This whitepaper describes the practical and financial benefits of improving system reliability and explores some tools that help manufacturers achieve their goal of highly reliable, high-availability systems.

Read more...

 

 


White Papers - Archives

“Economics, Technology Drive Industry To Non-Intrusive Board Test”
By Alan Sguigna, Vice President, Sales and Marketing
December 2009

“Doing More with Less - An IEEE 1149.7 Embedded Tutorial: Standard for Reduced-pin and Enhanced-functionality Test Access Port and Boundary-Scan Architecture
By Adam Ley, chief technologist – boundary scan test
ITC, November 2009

“Defect Coverage for Non-Intrusive Board Tests”
By Adam Ley, chief technologist – boundary scan test
November 2009

“Synergy of Two Emerging Standards Will Drive 3D Chip and Circuit Board Test into High Gear”
By Al Crouch, chief technologist – core instrumentation
November 2009

“Non-intrusive Board Test Strategies for the Intel® Xeon® processor 5500 Series”
By Dave Bonnett, Eric Johnson and Larry Osborn
August 2009

Position Paper — Embedded Instrumentation Ushers in a New Era for the Test and Measurement Industry — By Glenn Woppman, president and CEO, ASSET InterTech

Frequently Asked Questions (FAQ): Embedded Instrumentation — The future of advanced design validation, test and debug

Media Fact Sheet — Embedded Instrumentation Gains Broad Traction Across the Electronics Industry

Media Fact Sheet — Embedded Instrumentation Comes in Many Shapes, Sizes and Flavors

Lead-free assembly shifts test methods toward boundary scan

Using Boundary Scan to Link Design and Manufacturing Test

Device Modeling Is Critical for Fast Time-to-Test

System Test with Boundary Scan (JTAG)

Fault Coverage Reporting

Boundary scan helps EMS companies cut test costs and increase revenues

Reptron Manufacturing Services – A white paper evaluating ASSET InterTech’s ScanWorks System

Agilent white paper on how ScanWorks has saved Lucent $1 million

Agilent white paper on Jabil’s evaluation of ScanWorks

 

HomeTopMore

 

PRIVACY STATEMENT  |  CONTACT US  |  SITE MAP  |  RESOURCES

2201 N. Central Expy., Ste 105, Richardson, TX 75080
(888) 694-6250 or (972) 437-2800
Copyright © 2001-2010 ASSET InterTech Inc. All rights reserved.