ASSET InterTech's Boundary-Scan Test, Processor-Controlled Test and Intel® IBIST form a unique set of tools for access to, and control of embedded instrumentation.
A motherboard with five daughtercards just wasn’t getting the test coverage that the manufacturer wanted from its in-circuit test (ICT) systems. As a result, Testing House Mexico, a member of ASSET®’s network of Partner Providers, was called in and eventually deployed a boundary scan test solution integrated into the manufacturer’s ICT systems. The solution involved the ScanWorks platform for embedded instruments integrated with Agilent Medalist 3070 ICT systems.
“The ICT systems weren’t able to treat the entire
assembly of one main motherboard and five daughtercards as one
unit under test (UUT),” said Juan Jose Montes, senior test
engineer for Testing House. “And there were sections of the
motherboard and daughtercards where there was no way to get probe
access for ICT test. We had to come up with a boundary-scan test
solution and that’s where ScanWorks integrated into the Agilent
3070 was able to deliver the test coverage we couldn’t get
otherwise.”
ASSET InterTech has helped many companies in numerous industries implement successful JTAG and DFT solutions. Check below and read how we've brought innovative solutions to the following industries.
Trying to improve product quality and reduce defects? Struggling with how to take advantage of Test Re-use? Interested in integrating ICT into your environment? We have brought successful solutions on these and other areas of interest to a wide range of clients. Read the articles below for more information.
PRIVACY STATEMENT | CONTACT US | SITE MAP | RESOURCES
2201 N. Central Expy., Ste 105, Richardson, TX 75080
(888) 694-6250 or (972) 437-2800
Copyright © 2001-2010 ASSET InterTech
Inc. All rights reserved.
