ASSET InterTech's Boundary-Scan Test, Processor-Controlled Test and I/O Instrumentation for Intel® IBIST are unique tools for access, auto­mation and analysis of embedded instrumentation.

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 PCT Overview

 PCT In Depth

 PCT Hardware

 PCT Software

 Automated Tests

 Interactive Tests

 Test Development

 Flash Programming

 Boundary Scan Tests

 BIOS Trace Utility

 PCT Applications

 PCT Resources

 PCT Product Selector

Processor-Controlled Test (PCT) provides all the tools you need to investigate your board's setup and operation.

Processor-Controlled Test Development Station - Interactive Test Mode

The Interactive Mode (shown below) provides direct access to low level test routines. No programming is required in this mode, which is intended for board investigation during development or debug. Test parameters are entered in the left-hand window and test results are displayed in the right-hand window.

 

Interactive Mode

Test routines include:

  • CPU Signals (checks CPU logic levels)
  • Bus Tests
  • RAM Tests
  • ROM Tests
  • Memory Access (read/write/dump)
  • I/O Access (read/write/dump)
  • Stimulus (looping logic patterns for probing faults)
  • Flash Programming (see this section for details)
  • Boundary Scan Tests (see this section for details)

These low-level test routines are the building blocks that are used in Processor-Controlled Test Manufacturing Station.

Click the "more" button below to find out about Test Development.

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