ASSET InterTech's Boundary-Scan Test, Processor-Controlled Test and I/O Instrumentation for Intel® IBIST are unique tools for access, automation and analysis of embedded instrumentation.

Processor-Controlled Test (PCT) is one of the fastest methods on the market to perform in-system programming (ISP) of Flash and EEPROM devices
The Fast Flash Programming feature is ideal for board manufacturing, high volume firmware upgrades, and large binary images.
PCT Fast Flash Programming is an alternative to the Standard Flash Programming function provided in the Interactive mode of the Test Toolkit software. Fast Flash Programming offers significant speed increases for certain processor types.
Depending on the type of flash and the way it is implemented on the board, programming times can be less than 10 seconds per megabyte.
Processor types currently supported by the Fast Flash Programming feature are:
The Fast Flash Programming feature is more suited to board manufacture and high volume firmware upgrades because the user needs to develop a relatively simple, flash-specific programming algorithm in assembly language and a short PCT test script. However, the time and cost saved in manufacturing far out-weighs the program development effort.
For a full description of the Fast Flash Programming feature, please see Application Note #9.
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