ASSET InterTech's Boundary-Scan Test, Processor-Controlled Test and I/O Instrumentation for Intel® IBIST are unique tools for access, automation and analysis of embedded instrumentation.

PCT Applications

Fast Functional Test

Dead Board Debug

Guided Fault Isolation

Fast Flash Programming

PCT Resources

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Processor-Controlled Test (PCT) Applications

This section is divided into the following sub-topics:

Fast Functional Test
Dead Board Debug
Guided Fault Isolation
Fast Flash Programming

Click any of the above links to go to that page. The main topics are also linked from the left-hand menu. Sub-topics are displayed when a main topic is clicked.

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