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Testability Checklist : 
Chip & Board Testability Assessment Checklist
Prepared by
Ben Bennetts, DFT Consultant
for ASSET InterTech, Inc.
1 July 2005

Abstract:
This document summarizes a checklist of questions to assist
testability assessment of a board mostly from a boundary-scan
perspective but also from other test perspectives (ICT, FPT,
AXI, AOI). The checklist is based on a set of Chip and Board
Testability Guidelines, available from the author, also available
on ASSET InterTech’s web site, www.asset-intertech.com.

1. Before You Start
1.1. Data Requirements
Before you start, you will need:
- Board level netlist
- BSDL files for all IEEE 1149.1 devices and, if
present, 1149.4, 1149.6 and 1532 devices
- Cluster model files, also known as characteristic
model files, containing IO and functional data for all non-boundary-scan
devices
- Board schematic
- Data sheets for the devices on the board
- Bill Of Materials (BOM)
- A board
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