ScanWorks® JTAG Test Development Station Bundle

Design Browser

The InterComm Design Browser from PTC, Inc. provides many benefits. First, it provides a direct link between CAD tools and ScanWorks’ test generation tools. In addition, test engineers have access to all design data in an easy-to-use interface without having to learn how to use the CAD tools. Testability comments can be annotated in the files and returned to designers for review. Design changes can be immediately communicated to test engineers. In addition, the Design Browser extracts the interconnect information (netlist) that’s needed for test generation and then displays the location of faults in either a layout or schematic view.

Process Automation Scripting API

Process Automation Scripting calls function libraries to include a predefined function in a test. Process Automation Scripting is compatible with any language that supports COM (Microsoft’s Common Object Model), including Test Control Language (Tcl) or Perl. Scripts developed with ScanWorks’ Process Automation Scripting can create test projects, designs and test actions, or a script can integrate actions into a test flow that consists of other types of tests. Scripts that automate repetitive test generation processes can save an enormous amount of test development time. JTAG or boundary scan gives you access to your entire design at any level, from individual scan cells to entire test registers or subsets of test registers. With Process Automation Scripting specialized functions and procedures you can control or observe a specific pin or create a complete test for a cluster of non-boundary-scan logic. ScanWorks scripts can be applied as part of a complete boundary-scan test process or scripts can be run outside of the ScanWorks environment.

Interactive Debugger and Scan Analyzer

The Debugger/Scan Analyzer gives you powerful tools to debug tests that have been created with macros or as SVF files. The debugger gives access to boundary-scan cells and registers from the device, board or system level. You control when the scan operations occur and the values shifted into the device. Then, you can observe in either a register view or a pin view the results that are shifted out. You can even single-step macro programs or SVF files to see the results of each scan. The Scan Analyzer provides either a waveform or a state table view of the program or file’s execution. Any mis-compare is highlighted so you can see what caused them.

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