JTAG  
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PRODUCTS

BSDL Services:
BSDL Validation Service
ScanWorks®
Boundary-Scan Products:

Interconnect Development Station
Interconnect Repair Station
Test Development Station
Diagnostic & Repair Station
Manufacturing Station
Programming Stations
IEEE 1149.6
Emergency License Tokens
Hardware Overview

IBIST Products:
ScanWorks® Intel® IBIST
Emulation Products:
MicroMaster
ICT Products:
ScanWorks® for Agilent's Medalist ICT
Technology:
Test Automation
System-Level JTAG


 

ScanWorks® JTAG Test Development Station Bundle

Optional Products

Extended JTAG Coverage Based on International Test Technologies’ µMaster

ScanWorks Extended JTAG Coverage incorporates the emulation-based functional test technology of µMaster (pronounced microMaster) from International Test Technologies. ScanWorks Extended JTAG Coverage takes advantage of the fact that many microprocessors feature JTAG ports for emulation testing. Emulation products such as µMaster from International Test Technologies use the processor’s JTAG port to take control of the processor and instruct it to carry out various functional test routines. Now, with ScanWorks Extended JTAG Coverage, boundary scan tests can be executed on components like memory devices that do not have boundary-scan capabilities but which can be accessed by the system’s microprocessor. Combining JTAG test and microprocessor emulation technology gives ScanWorks the ability to reach places on a printed circuit board where boundary scan could not reach on its own, not only extending JTAG structural test coverage significantly, but also adding functional test capabilities on the same ScanWorks test platform. This extended test coverage can reduce the requirements for other test types such as ICT, MDA or flying probe, significantly reducing test development time and overall test costs.

The integration of µMaster into ScanWorks provides a seamless method of applying µMaster emulation-based tests from a ScanWorks-based test platform. Emulation-based tests are fully developed within the µMaster environment and then imported into ScanWorks as a ScanWorks action with all the capabilities of ScanWorks actions. Within ScanWorks, the user selects the emulation-based tests to be included in an action. When the action is applied, ScanWorks calls the µMaster run-time software to execute emulation tests through the µMaster Functional Test Controller Card and interface pod. When the emulation test is complete, µMaster returns Pass/Fail information to ScanWorks along with any diagnostic messages. ScanWorks incorporates this response into the ScanWorks run-time log.

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