ScanWorks® PCI-100 JTAG Controller

PCI-100 Board Voltage

The PCI-100 controller card supports 3.3V (5.0V tolerant) input/output signals. With the provided cables and properly terminated and driven signals, the controller card supports a TCK frequency of 16.6 MHz at a distance of 4 feet to the board or system under test. Lower frequencies have been verified to operate up to eight feet from the controller card.

Support for board voltages from 1.8V to full 5.0V is provided with the optional pod. Support for 1.8V, 2.5V, 3.3V, and 5.0V is either automatically or manually selected. If a reference voltage from the board is provided, the pod automatically selects the proper interface. Alternatively, the interface can be selected with switches provided on the pod. LEDs on the pod indicate the selected voltage. See the PCI-100 documentation for specifications.

PCI-100 Differential TAP Signal Support

The PCI-100 controller card provides differential output signals to allow the pod or a test fixture to be located more than 16 feet from the host PC, at the maximum TCK frequency of 16.6 MHz. Differential signal specifications are provided allowing you to design the interface into your test fixture. This eliminates the need for the pod.

PCI-100 TAP Monitor Port

The optional pod provides external signals to monitor the current TAP state, the TCK and TMS signals, and the DR and IR shift signals. These signals are especially useful to monitor software control of the TMS signal when verifying a new TAP controller design in a custom device.

PCI-100 Physical Features

The PCI-100 and pod are built to commercial environmental standards for the U.S. and Europe. The pod is EMI shielded to eliminate noise in a laboratory or manufacturing environment. See the PCI-100 documentation for complete specifications.

Full Life-Cycle Support

During the design/debug or the field service stage of your product’s life cycle, the PCI-100 controller card provides you with a robust and flexible interface from your host test platform to your board. It is fast enough to provide maximum scan throughput to all but the most highly optimized scan paths, yet inexpensive enough to be used in high volume production. By using the same controller in design/debug test development and manufacturing, you eliminate any question of compatibility. Also, if you have an embedded application for field support that uses the TI SN74LVT8980, you can be sure of test compatibility.

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