ScanWorks® JTAG Manufacturing Station

Options

Several optional features such as diagnostic capabilities can be added to a ScanWorks Manufacturing Station, enabling its use as a repair station when not in use as a manufacturing station. These features include Interconnect Pin-level Diagnostics and Graphical Fault Highlighting.

Interconnect Pin-Level Diagnostics

A manufacturing station includes interconnect diagnostics to the net level. In many cases, depending on the level of boundary-scan access available, a defect can be isolated to a specific pin, saving many hours of manual diagnostics and avoiding the replacement of the wrong component. The pin-level diagnostic report will identify the most likely location of the defect as well as al the connections to the pin.

The Pin-Level Diagnostic report can be viewed as either a text file or in HTML format. It can be saved as an XML or XSL file for use by data management tools. It also includes links from each connection to the net to a graphical view of the board layout or schematic in ScanWorks’ InterComm Design Browser. A fragment of a pin-level diagnostic report is shown below.

Graphical Fault Highlighting

The Graphical Fault Highlighting feature gives you access to a graphical view of the board layout using the powerful InterComm Design Browser. Interconnect test and Memory Access Verification test reports are linked to the layout view by clicking on a pin or net in the report. Cross hairs pinpoint the location of the pin or net in the layout view and the Design Browser gives access to all of the available information about that pin as well as showing the exact routing of the net connected to that pin. You can easily locate the suspected pin on the actual board being tested and quickly inspect it for obvious defects. You can cross-highlight the layout view to a schematic view to see the functional logic associated with the pin. ScanWorks’ integrated InterComm Design Browser is provided by PTC, Inc. Additional information about the InterComm Design Browser is available at www.ptc.com.

Testing Multiple UUTs

With the addition of the Multi-Card/Multi-Pod option and the hardware to support it, a ScanWorks Manufacturing Station can test more than one UUT at a time. A system configured with multiple PCI-400 controller cards and pods can test as many as 24 UUTs at once. Some applications such as flash programming are done concurrently, while other test that are less time–intensive, such as interconnect tests, are usually done sequentially. ScanWorks automatically selects the best method of application.

The PCI-100 or PXI-100 controllers can be connected to multiple scan paths using the Four TAP Buffer/Pod. With this pod any one scan path can be selected individually for fast access or more than one scan path can be combined logically into one path for more efficient interconnect testing.

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