ScanWorks^® JTAG Interconnect Development Station Bundle

Interconnect Development Station Options

Several options to the ScanWorks Interconnect Development Station will increase test coverage or improve the efficiency of test generation and deployment to manufacturing.

Flash Memory Program Generation

The flash memory on-board programming option can be added to an Interconnect Development Station to take further advantage of the boundary-scan features of your board. With netlist information and flash memory models ScanWorks automatically detects the boundary-scan signals that program flash devices. Then, programming operations are generated to read and write to flash memory.

For details on Flash Memory Program Generation see the Flash Memory Program Generation fact sheet on the ASSET web site.

Interactive Debugger and Scan Analyzer

The Debugger/Scan Analyzer gives you powerful tools to debug tests that have been created with macros or as SVF files. The debugger gives access to boundary-scan cells and registers from the device, board or system level. You control when the scan operation occurs and the values shifted into the device. Then you can observe the results shifted out in either a register view or a pin view. You can single-step macro programs or SVF files to see the results of each scan. The Scan Analyzer provides either a waveform or a state table view of the execution of a macro program or SVF file. Any miscompares are highlighted so you can see what caused them.

For details on Interactive Debugger & Scan Analyzer see the Interactive Debug & Scan Analyzer fact sheet on the ASSET web site.

Process Automation Scripting

With Process Automation Scripting libraries of functions can be used to perform a variety of functions in a test you’re developing. Process Automation Scripting is compatible with any language that supports COM (Microsoft’s Common Object Model), such as scripting languages like Test Control Language (Tcl) or Perl. Scripts developed with ScanWorks’ Process Automation Scripting can create test projects, designs and test actions, or a script can integrate actions into a test flow along with other types of tests. Scripts that automate repetitive test generation processes can save an enormous amount of test development time. You have access to your design at any level, from individual scan cells to entire test registers or subsets of test registers. With specialized functions and procedures you can control or observe a specific pin or create a complete test for a cluster of non-boundary-scan logic. ScanWorks scripts can be applied with the script action as part of a complete boundary-scan test process or scripts can be run outside of the ScanWorks environment.

Previous : Next                   Page 8 of 8          Back to Page 1