ASSET InterTech's Boundary-Scan Test, Processor-Controlled Test and Intel® IBIST form a unique set of tools for access to, and control of embedded instrumentation.
September 20, 2011 – With new tools for the ASSET® ScanWorks® platform for embedded instruments engineers can simply select instruments they need, set their parameters and insert them into a field programmable gate array (FPGA) to function as a circuit board tester. Once inserted, ScanWorks FCT operates the board-tester-in-a-chip from a drag-and-drop user interface to perform validation, test and debug. Read more »
November 29, 2011 - ASSET ScanWorks FCT named to EDN magazine's Hot 100 Products list
November 1, 2011 - ASSET’s new Ethernet controller for ScanWorks® tests four circuit boards at once
“Standard aims embedded instruments at general test”, Al Crouch, Electronic Products, July 28, 2011
“ScanWorks sieht, was der Chip sieht” (ScanWorks sees that the silicon sees), Glenn Woppman, Markt & Technik, May 20, 2011 (pdf)
“Bauelemente ubernehmen Testfunktionen”, Alan Sguigna, Elektronik, May 2011 (pdf)
“Non-Intrusive Board Bring-Up: Software tools ensure fast prototype bring-up”
By Alan Sguigna, Vice President Sales and Marketing
“FPGA-Controlled Test (FCT): What it is and why is it needed?”
By Al Crouch, Chief Technologist, Core Instrumentation
“IEEE P1687 Internal JTAG (IJTAG) taps into embedded instrumentation”
By Al Crouch, Chief Technologist, Core Instrumentation
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