ASSET InterTech's Boundary-Scan Test, Processor-Controlled Test and Intel® IBIST form a unique set of tools for access to, and control of embedded instrumentation.

News / Resources

Feature Story

Media Contacts:
Bob Greenfield
G&A PR
(972) 254-2887
bob.greenfield@verizon.net

Press Room - Feature Story

ASSET and IPextreme collaborate to enable ScanWorks as an IEEE 1149.7 test solution

July 14, 2010 - ASSET® InterTech (www.asset-intertech.com), the leading supplier of open tools for embedded instrumentation, will integrate test adapter intellectual property (IP) from IPextreme into its ScanWorks® platform for embedded instruments to enable chip and circuit board tests under the new IEEE 1149.7 reduced-pin boundary scan standard. Read more »

Press Releases

July 14, 2010 - ASSET® and IPextreme collaborate to enable ScanWorks® as an IEEE 1149.7 test solution

May 18, 2010 - ASSET® is first to support new Intel® Xeon® processors 5600/7500 series and Itanium® 9300 processors with validation and test tools

March 11, 2010 - ScanWorks enhanced with comprehensive validation tools for high-speed I/O on future Intel platforms

February 24, 2010 - ScanWorks platform for embedded instruments named finalist for EDN's Innovation Award

January 6, 2010 - ASSET notches two more Best in Test finalist awards from Test & Measurement World magazine

November 3, 2009 - ASSET's ScanWorks® supports PLX Technology's PCI Express switch family's visionPAK diagnostic toolset

More Press Releases »

ASSET In The News

ScanWorks validation and testing tools for Intel®’s future. Circuitnet, March 2010

ASSET’s Al Crouch discusses innovative test strategies for 3D stacked die chips. 3Dincites.com, December 2009

Best in Test Finalists 2010: DFT, boundary scan, and emulation, Test & Measurement World, December 2009

ASSET's ScanWorks Supports PLX Technology's PCI Express Switch Family's visionPAK Diagnostic Toolset, PCBCafe, November 2009

Strategic Relationship with SiliconAid Extends ASSET's ScanWorks Platform Into Chip Test and Verification, Evaluation Engineering, November 2009

ASSET InterTech's Dehne - Seeking Growth in Embedded Instrumentation, Test & Measurement World, July 2009

More ASSET In The News »

Authored Articles

"Driving 3D Chip and Circuit Board Test into High Gear" by Al Crouch, CTO Core Instruments, Future-Fab International, April 2010

"3D-Chips auf dem Vormarsch: Herausforderungen bei Testverfahren" by Glenn Woppman, President & CEO, Embedded Design Germany, April 2010

"TAP und IJTAG: Synergie zweier zukunftsträchtiger Standards" by Glenn Woppman, EPP Europe, March 2010

"Embedded Instrumentation Has Intel® Xeon® Processor 5500 Series Designs Covered” by Tim Caffee, Embedded Intel Solutions Winter 2010

More Authored Articles »

CONNECT Newsletter

IEEE 1149.7 and P1689 - dispelling the misconceptions

ScanWorks® delivers the test coverage that ICT can't

Validation and test of boards carrying latest Intel® Xeon® 5600 and 7500 series and Itanium® 9300 series processors

Testing DDR3 memory interconnects - new ScanWorks® features

Ever heard of PCOLA/SOQ/FAM?

More Connect Newsletters »

White Papers

“Embedded Diagnostics for Highly Available Systems”
By Larry Osborn, Technical Product Manager, Processor-Controlled Test and Alan Sguigna, Vice President, Sales and Marketing
April 2010

“Doing More with Less - An IEEE 1149.7 Embedded Tutorial: Standard for Reduced-pin and Enhanced-functionality Test Access Port and Boundary-Scan Architecture”
By Adam Ley, chief technologist – boundary scan test
ITC, November 2009

“Defect Coverage for Non-Intrusive Board Tests”
By Adam Ley, chief technologist – boundary scan test
November 2009

More White Papers »