ASSET InterTech's Boundary-Scan Test, Processor-Controlled Test and Intel® IBIST form a unique set of tools for access to, and control of embedded instrumentation.

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News & Announcements

July 14, 2010 - ASSET and IPextreme collaborate to enable ScanWorks as an IEEE 1149.7 test solution


May 18, 2010 - ASSET is first to support new Intel® Xeon® processors 5600/7500 series and Itanium® 9300 processors with validation and test tools


March 11, 2010 - ScanWorks enhanced with comprehensive validation tools for high-speed I/O on future Intel platforms


Feburary 24, 2010 - ScanWorks platform for embedded instruments named finalist for EDN's Innovation Award


January 6, 2010 - ASSET notches two more Best in Test finalist awards from Test & Measurement World magazine


November 3, 2009 - Strategic relationship with SiliconAid extends ASSET's ScanWorks® platform into chip test and validation


November 3, 2009 - ASSET's ScanWorks supports PLX Technology's PCI express switch family's visionPAK diagnostic toolset


September 22, 2009 - ASSET's new interposer opens test access to Intel® Xeon® processors 5500 series and Core™ i7 processors


August 19, 2009 - Cray selects ASSET's ScanWorks platform for embedded diagnostics in next-generation supercomputers


August 4, 2009 - ASSET's Dispatcher for ScanWorks® applies tests simultaneously to an unlimited number of circuit boards


June 17, 2009 - Dehne, longtime National Instruments executive, joins ASSET's Board of Directors


May 6, 2009 - ASSET ScanWorks platform is first to support both validation and test for new Intel Xeon processor 5500 series


February 2, 2009 - ASSET InterTech's Woppman named one of only four finalists for "Innovator of the Year"


January 27, 2009 - ASSET Remote Instrumentation Controller named Best In Test Finalist for 2009


January 20, 2009 - ASSET's ScanWorks for Embedded Boundary Scan offers in-system JTAG test and diagnostics


October 28, 2008 - ASSET joins Synopsys in-Sync" Program to Advance Embedded Instrumentation Tools


September 24, 2008 - ASSET's new Internet-based controller family enables world wide test


September 11, 2008 - ASSET brings JTAG test tools perspective to IEEE 1149.7


September 9, 2008 - Flexible licensing gives global access to ASSET's MicroMaster JTAG functional test system


August 26, 2008 - ASSET assumes a leadership position as one of the founding members of iNEMI's boundary scan (JTAG) adoption initiative


August 19, 2008 - ASSET's ScanWorks® Supports On-Chip Evaluation of Avago Technologies' ASICs


August 12, 2008 - Maxim seeks ASSET ScanWorks' embedded instrumentation support for its system and power management chips


June 17, 2008 - ASSET® is first to support Intel's new Nehalem micro-architecture and Tolapai SOC with CPU emulation test and diagnostics


June 10, 2008 - ASSET® Works with Cadence to Drive Embedded Instrumentation for Deep Analysis of Complex ICs


May 13, 2008 - ASSET® Joins Mentor OpenDoor Program to ensure JTAG interoperability


May 13, 2008 - ASSET controller is first to support three distinct types of embedded instrumentation


May 13, 2008 - ASSET aligns company, technology and products with embedded instrumentation


April 29, 2008 - ASSET commits to developing open embedded instrumentation tools for Internal JTAG (IJTAG) standard


April 17, 2008 - TRI integrates ASSET®’s ScanWorks® boundary-scan technology into its test systems


April 1, 2008 - ASSET® is first to support Intel®'s new Atom™ processor with CPU emulation test and diagnostics


October 23, 2007 - ASSET® expands next-generation embedded instrumentation


August 21, 2007 - ASSET® and Agilent Technologies integration of in-circuit and JTAG test delivers cost competitive, high quality solution


June 19, 2007 - New Boundary-Scan Tutorial offers expanded information on complementary technologies


February 12, 2007 - ASSET's European Design-for-Test Lab improves yields on prototype designs


January 29, 2007 - ASSET's new Design-for-Test Lab validates JTAG capabilities in chip and board designs


Jan. 16, 2007 - ASSET's innovative design-for-test tool, DFT Analyzer™, named finalist for IEC DesignVision Award


October 11, 2006 - New features enhance openness of ASSET's ScanWorks® JTAG system to third-party technologies


October 4, 2006 - ASSET's® new controller is first to perform both JTAG and functional emulation testing


September 12, 2006 - ASSET® establishes Boundary-Scan (JTAG) Technology Center in Southeast Asia


May 16, 2006 - ASSET and Firecron demonstrate system-level JTAG proof-of-concept


Feb. 28, 2006 - ASSET® opens Boundary-Scan Technology Center in China


December 22, 2005 - ASSET® earns third consecutive "Best In Test" award


November 8, 2005 - ASSET® works to include system-level boundary-scan test into the MicroTCA spec


October 31, 2005 - ASSET® hosts new online boundary-scan validation service


October 17, 2005 - ASSET's DFT Analyzer™ validates design-for-test features before prototypes built


August 29, 2005 - ASSET® and International Test Technologies support CPU functional test and Intel®'s new embedded test technology


May 17, 2005 - ASSET® ScanWorks® selected by Microsoft® for Xbox 360® console testing


March 25, 2005 - ASSET® and American Arium support next-generation embedded test on Intel® processors and chipsets


March 8, 2005 - French telecomm firm deploys ASSET® ScanWorks® JTAG test system in design and manufacturing


March 1, 2005 - ASSET® names Logic Technology to support and distribute the ScanWorks® JTAG system in Germany


Feb. 22, 2005 - ASSET® ScanWorks® JTAG system integrated into new Agilent Medalist i5000 In-Circuit Test platform


Feb. 14, 2005 -ASSET® integrates Lattice's in-system configuration engine into its ScanWorks® JTAG system


Jan. 10, 2005 - ASSET's ScanWorks® JTAG system named "Best in Test" for high-speed bus testing


Nov. 16, 2004 - ASSET's design-for-test (DFT) services tapped by Xilinx for PLD boundary-scan validation


Oct. 26, 2004 - ASSET's ScanWorks® is first JTAG system capable of testing high-speed Gb/sec nets


Sept. 20, 2004 - ASSET's ScanWorks® is first boundary scan system with processor emulation for extended test coverage


August 17, 2004 - ScanWorksAPI easily integrates JTAG test into NI's LabView, TestStand and others


Aug. 16, 2004 - ASSET® tools align with Intel's next-generation embedded test technology


July 13, 2004 - ASSET® InterTech expands its management team to take advantage of growth opportunities


July 7, 2004 - ASSET expands European support for ScanWorks® JTAG test system


June 29, 2004 - ASSET opens direct support office in Hong Kong


June 17, 2004 - ASSET and Agilent Technologies Collaborate on Products That Span Benchtop Boundary-Scan Stations and High-Volume 3070 Test Systems


June 8, 2004 - New ScanWorks bundle makes boundary scan easy and affordable for first-time and occasional JTAG test users


May 10, 2004 - Unitestech agrees to distribute ASSET’s ScanWorks® JTAG system in Korea


April 26, 2004 - iNETest joins ASSET's Partner Provider program to serve fast growing Asian JTAG market


February 24, 2004 - ScanWorks® Assistant' accelerates "time-to-test" for first time users of JTAG/boundary scan


January 15, 2004 - TopCAT™ technology for JTAG test snaps up Best In Test honorable mention


September 30, 2003 - New TopCAT™ JTAG technology dramatically reduces boundary scan test development time


August 18, 2003 - New PXI controller for ASSET ScanWorks enhances compatibility with National Instruments' test executives in functional test


March 17, 2003 - New service validates accuracy of an integrated circuit's boundary-scan description file


December 16, 2002 - APG brings extensive JTAG and 3070 expertise to ASSET EDFT's Partner Provider program


October 22, 2002 - TTA joins ASSET's Partner Provider program

Test Technology Associates will offer ScanWorks' test services from it's Southwest US headquarters


October 8, 2002 - New multiple-port controller makes ASSET's ScanWorks the industry's fastest, most flexible boundary-scan manufacturing test system

PCI-400 optimizes ScanWorks for both high-volume and high-mix manufacturing environments.


October 2, 2002 - ASSET's Partner Provider progam adds The Test Connection


September 23, 2002 - New ScanWorks® boundary-scan system improves the memory access testing process

New integrated scripting capability streamlines test development.


September 5, 2002 - Vivace Networks is first to require ASSET's ScanWorks on contract manufacturers' Agilent 3070 ICT systems

Improved product quality, and reduced costs and time-to-market result from test re-use throughout a kproduct's lifecycle.


August 20, 2002 - Solution Sources becomes first U.S. firm to join ASSET's Partner Provider Program

Firm will offer ScanWorks™ test services in Silicon Valley and on West Coast


June 17, 2002 - Partner Provider program for ASSET's EDFT will accelerate test translation in manufacturing

Partner Provider program for ASSET's EDFT will accelerate test translation in manufacturing. Frist partner, BreconRidge, set to offer ScanWorks test services in Canada.


- April 30, 2002 - Vivace Networks reduces test costs and shortens its time-to-market with ASSET's ScanWorks

Vivace Networks reduces test costs and shortens its time-to-market with ASSET's ScanWorks


- February 26, 2002 - First Web-based e-Learning for boundary scan is centerpiece of ASSET's Internet strategy

Online e-learning and training, support automation and DFT education puts ASSET at the forefront of Web-based boundary-scan resources


- January 21, 2002 - New ScanWorks™ system improves product quality by reducing defect and speeding up test development

New ScanWorks(tm) system improves product quality by reducing defects and speeding up test development.


- January 13, 2002 - Asset's 'boundary-scan' products seeing a growing market


- December 3, 2001 - ASSET InterTech named one of the fastest growing private companies in North Texas

ASSET InterTech named one of the fastest growing private companies in North Texas


- October 29, 2001 - Agilent Technologies and ASSET InterTech Collaborate to Reduce Development Costs for Electrical Test

Integration of Companies' Products Result in Simplified, Seamless Test Flow Throughout Product Lifecycle


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