ScanWorks^® JTAG Boundary-Scan
           IO Module

The primary function of ScanWorks' boundary-scan IO modules is to provide test access to off-board signals that otherwise could not be accessed by a JTAG test system. For many designs, boundary scan has adequate access to on-board signals, but signals that go off the board often can not be tested by a JTAG tester. By adding JTAG access to these off-board signals, a ScanWorks boundary-scan IO module can increase the board's test coverage with boundary scan, possibly reducing the need for implementing another test method or for developing alternative tests to reach the required level of test coverage.

The Boundary Scan 400 IO module (BSIO-400) provides 400 JTAG accessible test channels that can be used to control and observe signals that go off the board. Each JTAG channel is controlled individually and can be configured as an input or output. The BSIO-400 scan path can be combined with the JTAG scan path of the board being tested so it is included in scan path verification and interconnect tests. Eventually, the BSIO-400 should be designed into the UUT test fixture.