ASSET InterTech's Boundary-Scan Test, Processor-Controlled Test and Intel® IBIST form a unique set of tools for access to, and control of embedded instrumentation.

 Return to Press Room

 News / Resources

 Feature Story

 Press Releases

 Authored Articles

 Connect Newsletter

 White Papers

 Events

 For Working Media

Media Contacts:
Bob Greenfield
G&A PR
(972) 254-2887
bob.greenfield@verizon.net

Get Connected - keep in touch with the latest technologies

Concise yet in-depth commentary by the leading experts on board, chip and system validation, test and debug. That’s what you’ll get with Connect. Don’t miss any of this useful information. Check out the contents of the current issue:

  • ICT is dying. What’s next for manufacturing board test?
  • Design validation by a firm in Ireland heads off costly problems in manufacturing
  • Beyond IO validation, high-speed IO BIST has a place in board test and debug
  • Intel®-enabled tools for validating DDR3, PEG and Intel® DMI high-speed buses on 2nd generation Core™ platforms
  • Why a platform for embedded instruments?
    ASSET’s CEO explains
  • Industry firsts: an embedded debugger for Intel x86 platforms and a toolkit for IEEE 1687 IJTAG
  • A new standard for 3D chip test emerges: IEEE P1838
  • Webinars, case studies, blogs

ICT - RIP

Simply fill out the form below to receive this issue of Connect.

 

 

HomeTopMore

 

PRIVACY STATEMENT  |  CONTACT US  |  RESOURCES

2201 N. Central Expy., Ste 105, Richardson, TX 75080
(888) 694-6250 or (972) 437-2800
Copyright © 2001-2010 ASSET InterTech Inc. All rights reserved.