ScanWorks® platform named finalist for EDN Innovation Award

Second such honor in two years demonstrates ASSET’s leadership in test and measurement innovation

The ScanWorks® platform for embedded instruments has been named a finalist in EDN magazine’s annual Innovation Awards program. Glenn Woppman, ASSET’s CEO and president, was named a finalist for Innovator of the Year in the previous year’s competition.

Instituted in 1990, EDN’s Innovation Awards honor the technologies, products and people that have shaped the semiconductor industry over the past year. This year’s finalists were featured in 30 categories. ScanWorks was named one of the five finalists in the “Design, Debug, and Production Test, Yield Analysis” category. Finalists were selected by the editors of EDN, a leading technical publication serving the semiconductor and electronic design community, based on “demonstrated innovation that resulted in a significant advance in technology and/or product development during the past 12 months.”

“Being recognized for innovation by the editors of EDN after the ScanWorks platform was twice named a finalist for “Best in Test 2009” by Test and Measurement World magazine is an amazing honor and quite a distinction,” said Glenn Woppman, president and CEO of ASSET. “Our roadmap for ScanWorks has always been to make it the leading validation and test platform in the industry. It’s gratifying to see it being recognized as such.”

Said Rick Nelson, EDN editor-in-chief, “In the Design, Debug, and Production Test, Yield Analysis category, ASSET’s ScanWorks was one of the outstanding submissions our editors chose.” Winners of the Innovation Awards were to be decided by an online vote.