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To read the many informative articles in previous issues of Connect, go to the the index page on our web site by clicking this link:

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OBSERVATIONS

Two Best in Test finalists demonstrate the tremendous upside leverage of embedded instrumentation

By Glenn Woppman
President and CEO
ASSET InterTech

Glenn WoppmanOne would have been great, but being named a Best in Test finalist twice in this year’s awards program by Test and Measurement World magazine is a tremendous accomplishment for the ScanWorks® platform for embedded instruments and a very real indication that the industry is recognizing the upside leverage of embedded instrumentation. It’s no coincidence that the two instances of ScanWorks that earned finalist status are deployed at different points in a system’s life cycle. ScanWorks leverages embedded instrumentation from start to finish.

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TEST DATA OUT

Embedded instrumentation overcomes variations in manufacturing

Eric JohnsonBy Eric Johnson
Product Manager, I/O Instrumentation

In this second half of a two-part article addressing the effects process and material variations have on circuit board quality, ASSET’s product manager for I/O instrumentation, Eric Johnson, examines some effective solutions, including the non-intrusive test technologies on the ScanWorks® platform for embedded instruments.

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INSIDE ASSET

ScanWorks® named Best in Test finalist twice!

Best in Test  - 2 FinalistsBest in Test  - 2 FinalistsScanWorks has gotten the nod – actually two nods – from the editors of Test and Measurement World magazine for the 2010 Best in Test awards. ScanWorks was named twice as a finalist in the ‘DFT, Boundary Scan and Emulation’ category. An online popularity vote will decide the winners of each category.

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Frost & Sullivan validates the industry’s need for embedded instrumentation

Frost and Sullivan whitepaperIn a recently published white paper and an upcoming webinar, the global market research and consulting firm Frost & Sullivan validated the necessity of embedded instrumentation for the test and measurement industry. The white paper asserts that “embedded instrumentation is projected to be the future of chip, board and system testing…”

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Embedded diagnostics bubbling to the top

As vice president of sales and marketing, ASSET’s Alan Sguigna has the pulse of the test and measurement marketplace. In a recent question-and-answer session, Alan took note of several issues that have been bubbling to the top of the industry’s collective consciousness lately. Embedded diagnostics is one that keeps coming up.

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Alan Sguigna

Alan Sguigna, VP Sales and Marketing

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Two new whitepapers address board test coverage and standards for 3D chip test

Two new white papersASSET has published two new whitepapers and they are available in the News Room on the web site. The first, by Adam Ley, chief technologist, boundary scan, discusses the extensive test coverage that is possible with non-intrusive board test technologies. The second whitepaper was written by Al Crouch, chief technologist, core instrumentation. It describes how two emerging standards, IEEE 1149.7 and IEEE P1687, will be integral to testing 3D multi-die chips.

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ScanWorks supports PLX’s embedded instrumentation in PCI Express chips

PLX TechnologyWith about 65 percent of the PCI Express® (PCIe®) switch and bridge chip market, PLX Technology, Inc. has been doing several things right. For one, the company has for some time now embedded an instrumentation suite into its PCIe chips. A second would be the recent announcement that ASSET’s ScanWorks® platform for embedded instruments would support PLX’s visionPAK embedded instruments.

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Strategic relationship with SiliconAid extends ScanWorks into chip test and verification

SiliconAid SolutionsASSET has extended the ScanWorks® platform for embedded instruments into chip-level test and verification by signing a strategic agreement with SiliconAid of Austin, TX. The agreement calls for ASSET to integrate SiliconAid’s chip debugger into ScanWorks and to resell SiliconAid’s IEEE P1687 IJTAG chip-level insertion and verification tools.

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ASSET in the news:

Al Crouch leads online discussion of 3D chip test

3D InCitesASSET has popped up in a number of forums lately, including an online discussion of 3D chip test issues lead by Al Crouch, chief technologist, core instrumentation. In addition, Alan Sguigna, vice president of sales and marketing, penned an article that was featured in Evaluation Engineering on the use of embedded instrumentation to perform non-intrusive test and validation. Several other articles by ASSET experts will be appearing soon.

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What’s New on the ASSET web site

EMC non-intrusive board test presentationThe ASSET web site is constantly being updated and refreshed. One of the most recent additions to the site is a link to a presentation by EMC Corporation from the recent Board Test Workshop which describes the company’s success with integrating non-intrusive board test strategies, including processor-controlled test, into its manufacturing flow.

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