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ASSET making lots of news

While the experts at ASSET have been busy writing several technical articles for industry publications, the editors of those publications have been seeking out insight from ASSET personnel to be included in other articles. The long and short of it is: ASSET’s name has been getting around a lot.

Here’s a quick list of some of the recent exposure ASSET has gotten:

Electronic Products Magazine

The September issue features an overview of the Internal JTAG (IJTAG) preliminary standard by the co-chairman of the IEEE P1687 working group, Al Crouch, who happens to be Chief Technologist, Core Instruments, for ASSET.

Click here for the article.

SOC Central web portal

Glenn Woppman’s article discusses the forces at work in the industry that are bringing about the emergence of embedded instrumenteation.

Click here for the article.

Components in Electronics (CIE) – UK publication

Glenn Woppman and Jeff Remmers discuss the complexities of validating and testing multi-die chip packages.

Click here for the article.

Electronic Design Magazine

A staff-written article by Editor Lou Frenzel reviews recent advancements in boundary scan technology, especially noting the increasing importance of embedded instrumentation.

Click here for the article.

New Electronics (UK publication)

Glenn Woppman is quoted extensively in this article, titled “Facing the Challenge.”

Click here for the article.

Evaluation Engineering Magazine

Al Crouch, ASSET Chief Technologist, Core Instruments, authored an article titled, “Open Tools and Standards Emerge for Embedded Instrumentation.”

Click here for the article.

IPexteme Times (Company newsletter)

Adam Ley, ASSET Chief Technologist, Boundary Scan, contributed an article to IPextreme’s company newsletter on the new IEEE 1149.7 standard which defines a two-wire JTAG interface with enhancements to the 1149.1 test access port (TAP).

Click here and scroll down to read the article.