ITC will be a busy place for ASSET
 The annual International Test Conference scheduled for next week (Oct. 21 - 26 in the Santa Clara Convention Center) will be a beehive of activity for ASSET. The theme of this year's conference is "Facing Nanometer-technology Test Challenges."
In the ASSET booth (No. 404), a number of demonstrations are planned. In addition to putting the ScanWorks boundary-scan test environment through its paces, ScanWorks’ Extended JTAG Coverage will demonstrate its combination of boundary-scan test and processor-based functional emulation test on one platform. Other demonstrations will involve ASSET’s BSDL validation and verification services, system-level JTAG capabilities, Internal JTAG (IJTAG) and embedded instrumentation, and ScanWorks’ support for Intel's® Interconnect Built in Self Test (IBIST).
 Moreover, several ASSET executives are fine-tuning their oratorical skills in preparation for presenting technical papers or workshops, or for participating in panel discussions.
Ben Bennetts, a long-time member of the ASSET Board of Directors and an industry design-for-test (DFT) consultant, will be presenting a retrospective on boundary scan with some thoughts on how DFT will evolve in the future. Ben's presentation will take place Tuesday, Oct. 23, 4 to 5:30 p.m.
ASSET's Chief Technologist, Adam Ley, has co-authored a lecture session on System JTAG (SJTAG) with Brad Van Treuren of Alcatel-Lucent. This lecture is entitled "System Test in a MicroTCA World" and it will also take place on Tuesday, Oct. 23, from 2 to 3:30 p.m. Brad will be making the presentation.
On Wednesday, Oct. 25 from 8:30 - 10 a.m., Alan Sguigna, ASSET vice president of sales and marketing, will make a corporate presentation on "Validating Semiconductor IEEE 1149.1 (JTAG) Implementations."
Several interesting invited speakers will also be featured at this year's ITC. On Wednesday after lunch, Al Crouch, chairman of the IEEE P1687 (IJTAG) working group, will discuss "The Need for Standard and Efficient Interconnection and Access of Embedded-Everything."
For more details on this year's ITC, click here.
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