New Four-TAP Buffer Pod improves
test coverage and throughput
The new Four-TAP Buffer Pod for ScanWorks has four ports
for connecting to and combining as many as four physically
separate scan paths on a single circuit board or system
of boards.
By combining multiple scan paths, test
coverage is increased because the connections between
devices on different scan paths can be tested. Test
throughput increases as well since only one test must
be applied to a combined scan path, whereas separate
scan paths would require the application of multiple
tests. In addition, the overhead of simultaneously managing
several separate scan paths is eliminated when paths
are combined.
The four test access ports (TAPs) are
enabled by switches on the Four-TAP Buffer Pod for static
applications, or by discrete IO signals from the PCI-100
or PXI-100 Boundary-Scan Controllers for dynamic scan
path control. If more than one secondary TAP is active
simultaneously, the active TAPs are connected serially
to form one scan chain. The Four-TAP Buffer Pod extends
the voltages supported by PCI-100 or PXI-100 Boundary-Scan
Controllers from 3.3V only to a range, beginning at
1.5 and extending to 5.3V in 16 steps. The voltage is
selected by on-board switches or by discrete IO signals
from the PCI-100 or PXI-100 controllers. TAP signal
termination is configured by on-board jumpers. The Four-TAP
Buffer Pod must be used with either a PCI-100 or PXI-100
controller card. The differential signals from the controller
card to the pod extend the distance to the UUT up to
20 feet and support the maximum test clock frequency
of the controllers at that distance.
The Four-Tap Buffer Pod comes in a
sturdy enclosure for ruggedness and it will be available
this December.
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