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 Expanded Role for JTAG DFT
by Dave Bonnett, ASSET InterTech, Inc.
Don’t let poor DFT haunt your product for its entire life cycle.
In recent years, boundary scan has transformed itself. JTAG started more than a decade ago as a simple structural interconnect test technology. It now is a foundational embedded infrastructure capable of hosting a varied collection of structural and functional test technologies, diagnostics, and in-system programming techniques targeted at the chip, board, and system levels.
Along with the expanded role for JTAG, the expectations for boundary scan as well as its critical importance in many test and manufacturing strategies have increased accordingly. At this stage in JTAG’s development, fulfilling these expectations depends as much on how well or how poorly the JTAG infrastructure is designed into chips, circuit boards, and systems as it does on the innate capabilities of the boundary scan technology itself.
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