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HOT TOPICS

ScanWorks wins "Best In Test" for second year in a row!

ScanWorks for the Agilent Medalist i5000 and 3070

ScanWorks Intel® IBIST Tools

 
MEDIA CONTACTS

Bob Greenfield
G&A PR
(972) 254-2887
bob.greenfield@verizon.net

 
JTAG in the News

IEC News Release - ASSET's DFT Analyzer named DesignVision finalist:

IEC Announces 2007 DesignVision Finalists Recognizing
Best Tools and Products in Semiconductor Industry

IEC begins the New Year recognizing 2006’s top innovations in electronic design; the first public announcement of DesignVision winners takes place at the end of the month in Santa Clara at DesignCon 2007

CHICAGO – Jan. 11, 2007 – Giving tribute to pioneering developments judged as the most beneficial to the design engineering community, the International Engineering Consortium (IEC) today announced the finalists of the prestigious 2007 DesignVision Awards.

IEC President John Janowiak stated, “Our DesignVision Awards honor those catalyzing positive change in high-technology, business, and academia, completely in line with the IEC’s mission. We are delighted to announce the winners at this year’s DesignCon in Santa Clara and share the best design advancements with the entire industry.”

Read more...

Sum of the Parts
New Electronics - July 2008

External instruments down but not out
Taking the Measure - Blog on Test & Measurement World - May 2008

ASSET commits to developing open embedded instrument tools for the Internal JTAG (IJTAG) standard
EDA Cafe.com - April 2008
EE Times - April 2008
SMTA - April 2008
EDA Geek - Apirl 2008

The wall between structural and functional test
Test & Measurement World - March 2008

ASSET, Verigy go holiday shopping
Taking the Measure - Blog on Test & Measurement World - December 2007

Design validation/test tool supports Intel IBIST
eeProductCenter - November 2007

ASSET expands next-generaton embedded instrumentation -- ASSET ScanWorks® provides software solutions for Intel's at-speed design validation and test technology, Interconnect BIST (IBIST)
Semiconductor Packaging News - October 2007
EDA Cafe - October 2007
EDA Geek - October 2007
TMCnet - October 2007
Test and Measurement.com - November 2007

DFT Lab validates JTAG capabilities
Global-Electronics.net - February 2007 (pdf)

DFT Lab validates JTAG capabilities
Test & Measurement.com - February 2007 (pdf)

DFT Analyzer recognized as Design Vision Finalist
PCB Café - January 2007 (pdf)

DFT Analyzer recognized as Design Vision Finalist
PXI Technology - January 2007 (pdf)

Controller performs JTAG and emulation testing
Evaluation Engineering Magazine - February 2007

New ASSET controller performs JTAG and emulation testing
ATE World - October 2006

ScanWorks features new level of openness
SCM Directory - October 2006

Best in Test for 2006 -- Honorable Mention
Test and Measurement World - December 2006

Tech Trends: Manufacturing Test
Test and Measurement World - April 2005

Best in Test for 2005
Test and Measurement World - December 2005

Best in Test for 2004 -- Honorable Mention
Test and Measurement World - December 2003

ASSET InterTech introduced the ScanWorks Assistant, Scan Path Discovery, and Multiple Scan Support modules in the latest version of its ScanWorks boundary-scan software....
Test and Measurement World - April 2004

Unitestech distributes test systems in Korea
Test and Measurement World - August 2004

"Boundary-Scan Workstation"
Test and Measurement World - August 2004

"JTAG test re-use products"
Test and Measurement World - September 2004

"ASSET and Agilent collaborate on JTAG offerings"
Test and Measurement World - September 2004

"Boundary Scan Tool Adds Processor Emulation"
Test and Measurement World - November 2004

"ASSET highlights support for 1149.6 for AC coupled nets..." at ITC 2004
Test and Measurement World - December 2004

"Lockheed Martin Team Integrates State-Of-The-Art Technology to Conduct"
Lockheed Martin - January 2002  (pdf)

     
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