ASSET InterTech's Boundary-Scan Test, Processor-Controlled Test and Intel® IBIST form a unique set of tools for access to, and control of embedded instrumentation.
Circuitnet - March 12, 2010 - ASSET® InterTech, the leading supplier of open tools for embedded instrumentation, has enhanced its validation and testing tools for Intel®’s future platforms. In this arrangement, ASSET’s ScanWorks® platform for embedded instruments will continue to support Intel®’s Interconnect Built-In Self Test (IBIST) technology which is embedded in the chip company’s processors and chip sets, and ScanWorks will provide a comprehensive validation solution for high-speed input/output (I/O) on Intel platforms.
"For six years we’ve been the industry’s only provider of IBIST tools. During that time, we’ve gained a great deal of trust from Intel®. Both ASSET and Intel® have benefited from the relationship," said Tim Caffee, ASSET’s vice president of design validation. "We look forward to continuing this support with future Intel® platforms. Additionally, the ScanWorks platform’s I/O instrumentation tools are expanding beyond Intel®'s QuickPath Interconnect (QPI) high-speed serial bus to provide manufacturers with an expanded high-speed I/O validation solution."
ScanWorks® Validation and Testing Tool for Intel®'s future -
March 2010
Cirucitnet
Electronic Production World
TechnicWeblook
Embedded
Computing Design
Evaluation
Enginnering
Electronic Specifier
SOCcentral
Bloomberg Businessweek
Electro IQ
electronic-data
ScanWorks platform for embedded instruments named finalist for EDN's Innovation Award
FinanzNachrichten.de -
February 2010 (pdf)
ASSET’s
Al Crouch discusses innovative test strategies for 3D stacked die chips.
3Dincites.com - December 2009
ASSET's ScanWorks Support PLX Technology's PCI Express Switch Family's
visionPAK Diagnostic Toolset - November 2009
EDN -
(pdf)
EarthTimes - (pdf)
Circuitnet -
(pdf)
Fox
Business - (pdf )
IC Journal - (pdf)
PCBCafe -
(pdf)
Embedded
Computing Design - (pdf)
ElectroIQ - (pdf)
EPN_On-line - (pdf)
Strategic Relationship with Silicon Aid Extends ASSET's ScanWorks
Platform Into Chip Test avd Verificaiton - November 2009
Evaluation
Engineering - (pdf)
Circuitnet -
(pdf)
Earth Times - (pdf)
SOCcentral -
(pdf)
Embedded Computer Deisgn - (pdf)
EDA
Geek -
(pdf)
ASSET's new interposer opens test access to Intel Xeon processors 5500 series and Core i7 processors -
September 2009
BusinessWeek
ThomasNet
News -
(pdf)
SOCcentral - (pdf)
EDN - (pdf)
CompactPCI - (pdf)
EDA
Blog - (pdf)
DSP-FPGA.com -
(pdf)
Managing
Aautomation - (pdf)
AllBusiness
Cray
accounces partnership for embedded diagnostics in supercomputers -
August 2009
insideHPC -
(pdf)
Linux.com -
(pdf)
Yahoo!
Finance
BNET -
(pdf)
Embedded
Computing Design - (pdf)
Evaluation
Engineering - (pdf)
Electronic
Specifier -
- (pdf)
ASSET InterTech's Dehne - Seeking Growth in Embedded Instrumentation -
July 2009
Test&Measurement
World - (pdf)
ASSET
ScanWorks Platform is First to Support for Intel Xeon Processor
5500
Circuitnet - May 2009 (pdf)
ASSET presented some of the latest advances in the JTAG world, including IEEE 1149.6, IEEE P1687 (IJTAG), and Processor-Controlled Test
Agilent European Webinar - April 2009
Embedded Instruments Target Product Life Cycle
EDN - March 2009
ASSET presented verification and test methodologies for ensuring silicon compliance to IEEE 1149.1
Agilent US Webinar- December 2008
EMC Presentation on Intel® IBIST in Practice at the Board Test Workshop, Fort Collins, CO
September 2008
ASSET InterTech and Testing House Mexico Partnership
May 2008
Facing the Challenge
New Electronics - November 2008
The Embedded Plan for JTAG Boundary Scan
Electronic Design - September 2008
Sum of the Parts
New Electronics - July 2008
External instruments down but not out
Taking the Measure - Blog on Test & Measurement World - May 2008
ASSET commits to developing open embedded instrument tools for the Internal JTAG (IJTAG) standard
EDA Cafe.com - April 2008
EE Times - April 2008
SMTA - April 2008
EDA Geek - April 2008
The wall between structural and functional test
Test & Measurement World - March 2008
ASSET, Verigy go holiday shopping
Taking the Measure - Blog on Test & Measurement World - December 2007
Design validation/test tool supports Intel IBIST
eeProductCenter - November 2007
ASSET expands next-generation embedded instrumentation -- ASSET ScanWorks® provides software solutions for Intel's at-speed design validation and test technology, Interconnect BIST (IBIST)
Semiconductor Packaging News - October 2007
EDA Cafe - October 2007
EDA Geek - October 2007
TMCnet - October 2007
Test and Measurement.com - November 2007
DFT Lab validates JTAG capabilities
Global-Electronics.net - February 2007 (pdf)
DFT Lab validates JTAG capabilities
Test & Measurement.com - February 2007 (pdf)
DFT Analyzer recognized as Design Vision Finalist
PCB Café - January 2007 (pdf)
DFT Analyzer recognized as Design Vision Finalist
PXI Technology - January 2007 (pdf)
Controller performs JTAG and emulation testing
Evaluation Engineering Magazine - February 2007
Structural Testing of high-speed buses using Intel IBIST - slides - paper
International Test Conference (ITC) - October 2006
New ASSET controller performs JTAG and emulation testing
ATE World - October 2006
ScanWorks features new level of openness
SCM Directory - October 2006
Best in Test for 2006 -- Honorable Mention
Test and Measurement World - December 2006
Tech Trends: Manufacturing Test
Test and Measurement World - April 2005
Best in Test for 2005
Test and Measurement World - December 2005
Best in Test for 2004 -- Honorable Mention
Test and Measurement World - December 2003
ASSET InterTech introduced the ScanWorks Assistant, Scan Path Discovery, and Multiple Scan Support modules in the latest version of its ScanWorks boundary-scan software....
Test and Measurement World - April 2004
Unitestech distributes test systems in Korea
Test and Measurement World - August 2004
"Boundary-Scan Workstation"
Test and Measurement World - August 2004
"JTAG test re-use products"
Test and Measurement World - September 2004
"ASSET and Agilent collaborate on JTAG offerings"
Test and Measurement World - September 2004
"Boundary Scan Tool Adds Processor Emulation"
Test and Measurement World - November 2004
"ASSET highlights support for 1149.6 for AC coupled nets..." at ITC 2004
Test and Measurement World - December 2004
"Lockheed Martin Team Integrates State-Of-The-Art Technology to Conduct"
Lockheed Martin - January 2002 (pdf)
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